Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
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Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
€51.00
Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
€155.00
Surface chemical analysis — Surface characterization — Measurement of the lateral resolution of a confocal fluorescence microscope
€77.00
Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
€183.00
Surface chemical analysis — Electron spectroscopies — Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
€115.00
Laboratory equipment. Fume cupboards. General. Classification. Dimensions. Specifications.
€33.00
Mobilier de laboratoire - Recommandations de conception et d'installation - Partie 1 : généralités
€106.00
Laboratory design — Vocabulary
Approaches for the production of reference materials with qualitative properties
€166.00
Reference materials — Approaches for characterization and assessment of homogeneity and stability
€208.00
Reference materials — Requirements and recommendations for use
€124.00
Douches de sécurité - Partie 1 : Douches pour le corps raccordées au réseau d'eau utilisées en laboratoire
Douches de sécurité - Partie 2 : Unités de lavage d'yeux raccordées au réseau d'eau
Surface chemical analysis — Scanning probe microscopy — Guideline for the method and procedure for determining the temperature effects on AFM dimensional measurements
€75.00
