Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
€155.00
Laboratory glassware — Desiccators
€77.00
Gas analysis — Vocabulary
€115.00
Gas analysis — Contents of certificates for calibration gas mixtures
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
€208.00
Surface chemical analysis — Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
€261.00
Surface chemical analysis — Characterization of nanostructured materials
This product is not for sale, please contact us for more information
Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales
€183.00
Microbeam analysis — EMSA/MAS standard file format for spectral-data exchange
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Laboratory glassware — Filter flasks
Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
