31.080.01 : Semiconductor devices in general

NF EN 62374, C96-017 (01/2008)

NF EN 62374, C96-017 (01/2008)

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Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films - Dispositifs à semiconductors

€87.39

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NF EN 60749-35, C96-022-35 (12/2006)

NF EN 60749-35, C96-022-35 (12/2006)

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Semiconductor devices - Mechanical and climatic test methods - Part 35 : acoustic microscopy for plastic encapsulated electronic components - Dispositifs à semiconducteurs

€95.67

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NF EN IEC 62007-2, C93-801-2 (09/2025)

NF EN IEC 62007-2, C93-801-2 (09/2025)

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Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes fibroniques - Partie 2 : méthodes de mesureAutomatic translation from French : Optoelectronic semiconductor devices for application in fibronic systems - Part 2: measurement methods

€138.00

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UNE-EN 60191-6-10:2004

UNE-EN 60191-6-10:2004

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Mechanical standardization of semiconductor devices -- Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON

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UNE-EN 60749-1:2004

UNE-EN 60749-1:2004

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Semiconductor devices - Mechanical and climatic test methods -- Part 1: General

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UNE-EN 60749-8:2004

UNE-EN 60749-8:2004

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Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing

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UNE-EN 60749-14:2004

UNE-EN 60749-14:2004

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Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)

€60.00

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UNE-EN 60749-25:2004

UNE-EN 60749-25:2004

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Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling

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UNE-EN 60749-33:2005

UNE-EN 60749-33:2005

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Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave

€40.00

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UNE-EN 60749-24:2005

UNE-EN 60749-24:2005

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Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST

€47.00

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UNE-EN 60749-23:2005

UNE-EN 60749-23:2005

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Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

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UNE-EN 60749-30:2005

UNE-EN 60749-30:2005

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

€64.00

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NF EN 60617-5, C03-205 (03/1997)

NF EN 60617-5, C03-205 (03/1997)

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Graphical symbols for diagrams. Part 5 : semiconductors and electron tubes. - GRAPHISCHE SMBOLE FUER SCHALTPLAENE. TEIL 5 : SCHALTZEICHEN FUER HALBLEITER UND ELEKTRONENROEHREN. (EUROPAEISCHE NORM EN 60 617-5).

€143.80

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NF EN 60191-6-18, C96-013-6-18 (08/2010)

NF EN 60191-6-18, C96-013-6-18 (08/2010)

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Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-18 : règles générales pour la préparation des dessins d'encombrement des dispositifs à semiconducteurs pour montage en surface - Guide de conception pour les boîtiers matriciels à billes (BGA)

€106.33

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NF EN 60191-6, C96-013-6 (05/2011)

NF EN 60191-6, C96-013-6 (05/2011)

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Mechanical standardization of semiconductor devices - Part 6 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages

€123.39

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