Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
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Standard Specification for Gold Wire for Semiconductor Lead Bonding
€72.00
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
€65.00
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Standard Practice for Radiographic Examination of Semiconductors and Electronic Components
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics (Withdrawn 2023)
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 8 : méthode d'essai de la flexion de bandes en vue de la mesure des propriétés de traction des couches minces
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High-voltage direct current (HVDC) installations - System tests
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Electronic components - Long-term storage of electronic semiconductor devices - Part 8 : passive electronic devices
Dispositifs à semiconducteurs - Méthodes d’essais mécaniques et climatiques - Partie 34-1 : essai de cycles en puissance pour modules de puissance à semiconducteurs
€84.50
Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1 : méthode d’essai de détection de variation acoustique
€52.00
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
€47.00
