31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
UNE-EN 62031:2009

UNE-EN 62031:2009

Superseded Historical

LED modules for general lighting - Safety specifications

€64.00

View more
UNE-EN 62031:2009/A1:2013

UNE-EN 62031:2009/A1:2013

Superseded Historical

LED modules for general lighting - Safety specifications

€53.00

View more
UNE-EN 62031:2009/A2:2015

UNE-EN 62031:2009/A2:2015

Superseded Historical

LED modules for general lighting - Safety specifications

€40.00

View more
ASTM F72-21

ASTM F72-21

Superseded Historical

Standard Specification for Gold Wire for Semiconductor Lead Bonding (Withdrawn 2024)

This product is not for sale, please contact us for more information

View more
ASTM E1161-09

ASTM E1161-09

Superseded Historical

Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

This product is not for sale, please contact us for more information

View more
ASTM E722-09

ASTM E722-09

Superseded Historical

Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

This product is not for sale, please contact us for more information

View more
ASTM E722-09e1

ASTM E722-09e1

Superseded Historical

Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

This product is not for sale, please contact us for more information

View more
ASTM F1190-11

ASTM F1190-11

Superseded Historical

Standard Guide for Neutron Irradiation of Unbiased Electronic Components

This product is not for sale, please contact us for more information

View more
ASTM F1192-11

ASTM F1192-11

Superseded Historical

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

This product is not for sale, please contact us for more information

View more
ASTM F996-11

ASTM F996-11

Superseded Historical

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

This product is not for sale, please contact us for more information

View more
ASTM F1893-11

ASTM F1893-11

Superseded Historical

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

This product is not for sale, please contact us for more information

View more
ASTM F996-10

ASTM F996-10

Superseded Historical

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

This product is not for sale, please contact us for more information

View more
ASTM E431-96(2007)

ASTM E431-96(2007)

Superseded Historical

Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

This product is not for sale, please contact us for more information

View more
ASTM F1192-00(2006)

ASTM F1192-00(2006)

Superseded Historical

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

This product is not for sale, please contact us for more information

View more
ASTM F1892-06

ASTM F1892-06

Superseded Historical

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

This product is not for sale, please contact us for more information

View more