Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
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Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
IEC 61954:2011 Static var compensators (SVC) - Testing of thyristor valves
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Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
