Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
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Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
Standard Test Method for Measuring Unsaturated TTL Sink Current
Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
€28.00
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
€50.00
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
€35.00
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
€40.00
