31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN IEC 47(CO)1085:1990-04

DIN IEC 47(CO)1085:1990-04

Superseded Historical

Semiconductor devices; mechanical and climatic test methods, internal moisture content; identical with IEC 47(Central Office)1085

€34.30

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DIN IEC 60747-14-4:2002-09

DIN IEC 60747-14-4:2002-09

Withdrawn Most Recent

Discrete semiconductor devices - Part 14-4: Semiconductor accelerometers (IEC 47E/220/CD:2002).

€248.22

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DIN IEC 60749-23:2002-10

DIN IEC 60749-23:2002-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/1636/CD:2002)

€48.79

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DIN IEC 60749-33:2002-10

DIN IEC 60749-33:2002-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance; Unbiased autoclave (IEC 47/1637/CD:2002)

€48.79

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DIN IEC 60749-34:2003-01

DIN IEC 60749-34:2003-01

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power Cycling (IEC 47/1648/CD:2002)

€48.79

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DIN IEC 47(CO)756:1980-04

DIN IEC 47(CO)756:1980-04

Superseded Historical

General principles of measuring methods; revision of IEC publication 60147-2 (transistors)

€24.39

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DIN 45930-102*CECC 50001-046:1980-05

DIN 45930-102*CECC 50001-046:1980-05

Withdrawn Most Recent

Harmonized system of quality assessment for electronic components; detail specification, diode BAW 76

€34.30

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DIN 45930-104:1981-02

DIN 45930-104:1981-02

Withdrawn Most Recent

Harmonised system of quality assessment for electronic components; detail specification, NF-Transistor type BCY 59

€63.27

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DIN EN IEC 60749-23:2025-10

DIN EN IEC 60749-23:2025-10

Active Most Recent

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV:2024); German and English version prEN IEC 60749-23:2024

€69.91

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DIN EN 60749-27:2002-09

DIN EN 60749-27:2002-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing; Machine model (MM) (IEC 47/1624/CDV:2002); German version prEN 60749-27:2002

€63.27

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DIN EN 60749-26:2002-09

DIN EN 60749-26:2002-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing; Human body model (HBM) (IEC 47/1623/CDV:2002); German version prEN 60749-26:2002

€63.27

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DIN EN 60749-14:2002-09

DIN EN 60749-14:2002-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 47/1615/CDV:2002); German version prEN 60749-14:2002

€69.91

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DIN EN 60749-25:2002-09

DIN EN 60749-25:2002-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 25: Rapid change of temperature (air, air) (IEC 47/1616/CDV:2002); German version prEN 60749-25:2002

€63.27

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DIN EN 60749-29:2002-09

DIN EN 60749-29:2002-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/1625/CDV:2002); German version prEN 60749-29:2002

€91.03

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DIN EN IEC 60747-15:2025-08

DIN EN IEC 60747-15:2025-08

Active Most Recent

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 60747-15:2024); German version EN IEC 60747-15:2024.

€162.06

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