31.080.01 : Semiconductor devices in general

BS EN IEC 63244-1:2021

BS EN IEC 63244-1:2021

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Semiconductor devices. devices for wireless power transfer and charging General requirements specifications

€316.00

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BS EN IEC 60749-30:2020

BS EN IEC 60749-30:2020

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Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing

€193.00

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BS EN IEC 60749-20:2020

BS EN IEC 60749-20:2020

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Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect moisture soldering heat

€269.00

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BS EN IEC 60749-15:2020

BS EN IEC 60749-15:2020

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Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices

€193.00

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BS EN IEC 60749-28:2022

BS EN IEC 60749-28:2022

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Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). level

€374.00

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BS IEC 60747-5-15:2022

BS IEC 60747-5-15:2022

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Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on electroreflectance spectroscopy

€183.00

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BS IEC 62951-9:2022

BS IEC 62951-9:2022

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Semiconductor devices. Flexible and stretchable semiconductor devices Performance testing methods of one transistor resistor (1T1R) resistive memory cells

€193.00

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BS EN IEC 62435-9:2021

BS EN IEC 62435-9:2021

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Electronic components. Long-term storage of electronic semiconductor devices Special cases

€193.00

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BS IEC 62951-8:2023

BS IEC 62951-8:2023

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Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, stability of flexible resistive memory

€193.00

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BS EN IEC 60749-37:2022

BS EN IEC 60749-37:2022

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Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer

€269.00

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BS EN IEC 60749-39:2022

BS EN IEC 60749-39:2022

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Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components

€193.00

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BS EN IEC 63287-2:2023

BS EN IEC 63287-2:2023

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Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile

€193.00

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BS IEC 60747-18-4:2023

BS IEC 60747-18-4:2023

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Semiconductor devices bio sensors. Evaluation method of noise characteristics lens-free CMOS photonic array sensors

€193.00

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BS EN IEC 63364-1:2022

BS EN IEC 63364-1:2022

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Semiconductor devices. devices for IoT system Test method of sound variation detection

€193.00

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BS EN 61975:2010+A2:2022

BS EN 61975:2010+A2:2022

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High-voltage direct current (HVDC) installations. System tests

€404.00

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