Semiconductor devices. Mechanical and climatic test methods High temperature operating life
€165.00
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices. Mechanical and climatic test methods Solderability
€269.00
Semiconductor devices. Mechanical and climatic test methods Latch-up
Semiconductor devices. Mechanical and climatic test methods Power cycling
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
€193.00
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guidelines fine-pitch land grid array (FLGA)
Hand-held motor-operated electric tools. Safety General requirements
€404.00
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods shock
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
€355.00
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Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages Dimensions P-VSON
Mechanical standardization of semiconductor devices. General rules for the preparation outline drawings surface mounted device packages Design guide 1,50 mm, 1,27 mm and 1,00 pitch ball column terminal
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
