Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life - Dispositifs à semiconducteurs
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RECOMMENDED GRAPHICAL AND LITERAL SYMBOLS. SEMICONDUCTORS DEVICES, CONDENSERS.
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Standard Specification for Semiconductor Device Passivation Opening Layouts (Withdrawn 2007)
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GRAPHICAL SYMBOLS FOR DIAGRAMS. PART 5: SEMICONDUCTORS AND ELECTRON TUBES.
€82.00
Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide stacked Fine-pitch ball grid array and fine-pitch land (P-PFBGA P-PFLGA)
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Semiconductor devices sensors. PN-junction semiconductor temperature sensor
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Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages
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Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect moisture soldering heat
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor devices General
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Semiconductor devices. Mechanical and climatic test methods Die shear strength
€165.00
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement the analysis of other residual gases
