Semiconductor devices. Scan based ageing level estimation for semiconductor devices
€193.00
Semiconductor devices sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
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Semiconductor devices. interface for human body communication Functional type and its operational conditions
Semiconductor devices. Discrete devices Optoelectronic Photocouplers
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Semiconductor devices. interface for human body communication Capsule endoscope
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Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on temperature-dependent electroluminescence
Semiconductor devices. devices for energy harvesting and generation Test evaluation methods vertical contact mode triboelectric
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
€165.00
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Mechanical standardization of semiconductor devices Measurement methods the package warpage at elevated temperature and maximum permissible
Semiconductor devices. Constant current electromigration test
Semiconductor devices. Metallization stress void test
Semiconductor devices sensors. Generic specification for sensors
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Measuring methods package dimensions small J-lead packages (SOJ)
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Measuring methods package dimensions small packages (SOP)