31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
IEC 62779-2:2016

IEC 62779-2:2016

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IEC 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances

€133.00

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IEC 62779-1:2016

IEC 62779-1:2016

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IEC 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements

€133.00

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IEC 60747-5-6:2016

IEC 60747-5-6:2016

Superseded Historical

IEC 60747-5-6:2016 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

€441.00

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IEC 60747-5-7:2016

IEC 60747-5-7:2016

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IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

€186.00

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IEC 60747-6:2016

IEC 60747-6:2016

Superseded Historical

IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors

€499.00

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IEC 60747-2:2016

IEC 60747-2:2016

Superseded Historical

IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

€342.00

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IEC 62779-3:2016

IEC 62779-3:2016

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IEC 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions

€93.00

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IEC 60749-44:2016

IEC 60749-44:2016

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IEC 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

€186.00

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IEC 62047-25:2016

IEC 62047-25:2016

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IEC 62047-25:2016 Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area

€186.00

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IEC 61975:2010/AMD1:2016

IEC 61975:2010/AMD1:2016

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IEC 61975:2010/AMD1:2016 Amendment 1 - High-voltage direct current (HVDC) installations - System tests

€133.00

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IEC 60191-6-13:2016

IEC 60191-6-13:2016

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IEC 60191-6-13:2016 Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA)

€133.00

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IEC 62830-2:2017

IEC 62830-2:2017

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IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting

€93.00

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IEC 60747-16-1:2001/AMD2:2017

IEC 60747-16-1:2001/AMD2:2017

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IEC 60747-16-1:2001/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

€23.00

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IEC 62830-1:2017

IEC 62830-1:2017

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IEC 62830-1:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting

€186.00

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IEC 61954:2011/AMD2:2017

IEC 61954:2011/AMD2:2017

Superseded Historical

IEC 61954:2011/AMD2:2017 Amendment 2 - Static var compensators (SVC) - Testing of thyristor valves

€12.00

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