IEEE Standard for Ferroresonant Voltage Regulators
€122.00
IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors
€51.00
IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
€107.00
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
€95.00
IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays
€167.00
Standard Test Method for Measuring MOSFET Drain Leakage Current
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Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)
Test Method for Transistor Collector-Emitter Saturation Voltage (Withdrawn 1995)
Practice for Determining Safe Current Pulse Operating Regions for Metallization on Semiconductor Components (Withdrawn 1995)
Method for Measuring MOSFET Saturated Threshold Voltage
Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
Method for Measuring Mosfet Saturated Threshold Voltage (Withdrawn 1992)
Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)
Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical timing specifications
€355.00
