Dispositifs hyperfréquences - Circulateurs - Isolateurs
€145.67
Dispositifs hyperfréquences - Relais et commutateurs électromécaniques coaxiaux et en guides d'ondes
€131.33
Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-17 : règles générales pour la préparation des dessins d'encombrement des dispositifs à semiconducteurs à montage en surface - Guide de conception pour les boîtiers empilés - Boîtiers matriciels à billes et à pas fins et boîtiers matriciels à zone de contact plate et à pas fins (P-PFBGA et P-PFLGA)
€106.33
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (IEC 47E/768/CD:2021); Text in German and English
€140.00
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (IEC 63373:2022); German version EN IEC 63373:2022
€91.03
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020
€111.40
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020.
€98.32
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV:2020); German and English version prEN IEC 60749-37:2020
Wearable electronic devices and technologies - Part 402-3: Performance measurement method of wearables - Series 2: Accuracy of Heart Rate Determination (IEC 124/167/CD:2021); Text in German and English
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020); German version EN IEC 60749-20:2020.
€116.64
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021.
€145.14
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022
€84.58
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022.
€105.42
Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021); German and English version prEN IEC 63364-1:2021
