31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN EN IEC 60749-34-1:2024-08

DIN EN IEC 60749-34-1:2024-08

Active Most Recent

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2759/CD:2022); Text in German and English

€105.42

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DIN IEC 63150-3:2024-08

DIN IEC 63150-3:2024-08

Active Most Recent

Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 3: Human foot impact motion (IEC 47/2758/CD:2022); Text in German and English

€111.40

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IEEE C62.37:1996 (R2010)

IEEE C62.37:1996 (R2010)

Withdrawn Most Recent

IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices

€147.00

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IEEE C62.37.1:2000

IEEE C62.37.1:2000

Superseded Historical

IEEE Guide for the Application of Thyristor Surge Protective Devices

€123.00

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IEEE/ANSI N42.31:2003

IEEE/ANSI N42.31:2003

Active Most Recent

American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

€99.00

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IEEE 1620:2004

IEEE 1620:2004

Superseded Historical

Standard for Test Methods for the Characterization of Organic Transistors and Materials

€138.00

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IEEE 1620.1:2006 (R2012)

IEEE 1620.1:2006 (R2012)

Withdrawn Most Recent

IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

€85.00

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IEEE 1620:2008

IEEE 1620:2008

Withdrawn Most Recent

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

€95.00

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IEEE C62.59:2019

IEEE C62.59:2019

Active Most Recent

IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

€65.00

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DIN EN IEC 63287-1:2020-06

DIN EN IEC 63287-1:2020-06

Superseded Historical

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for LSI reliability qualification (IEC 47/2614/CDV:2020); German and English version prEN IEC 63287-1:2020

€150.65

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DIN EN IEC 60749-30:2019-09

DIN EN IEC 60749-30:2019-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 47/2562/CDV:2019); German version prEN IEC 60749-30:2019

€91.03

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DIN EN IEC 60749-20:2019-10

DIN EN IEC 60749-20:2019-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 47/2563/CDV:2019); German and English version prEN IEC 60749-20:2019

€122.34

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DIN EN 60747-16-5/A1:2019-10

DIN EN 60747-16-5/A1:2019-10

Superseded Historical

Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 47E/649/CD:2019); Text in German and English

€48.79

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BS 1497-1:1957

BS 1497-1:1957

Withdrawn Most Recent

Specification. Impregnated-asbestos-covered copper conductors Round wire

€269.00

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BS 1497-2:1957

BS 1497-2:1957

Withdrawn Most Recent

Specification. Impregnated-asbestos-covered copper conductors Rectangular

€269.00

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