Technologies et dispositifs électroniques prêt-à-porter - Partie 401-1 : dispositifs et systèmes : éléments de fonctionnement - Méthode d'évaluation de la jauge de contrainte extensible de type résistifAutomatic translation from French : Wearable electronic technologies and devices - Part 401-1: devices and systems: operating elements - Method for evaluating the resistive-type expandable strain gauge
€111.67
Semiconductor devices - Mechanical and climatic test methods - Part 44 : neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices - Mechanical and climatic test methods - Part 3 : external visual examination
€77.67
Semiconductor devices - Mechanical and climatic test methods - Part 4 : Damp Heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices - Mechanical and climatic test methods - Part 6 : storage at high temperature
€59.33
Semiconductor devices - Mechanical and climatic test methods - Part 9 : permanence of marking
Semiconductor devices - Part 16-3 : microwave integrated circuits - Frequency converters
Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
Normalisation mécanique des dispositifs à semi-conducteurs - Partie 1 : règles générales pour la préparation des dessins d'encombrement des dispositifs discrets
€131.33
LED modules for general lighting - Safety specifications - IEC 62031 Ed. 2 : Modules à LED pour éclairage général - Spécifications de sécurité
€120.03
Semiconductor devices - Mechanical and climatic test methods - Part 12 : vibration, variable frequency
Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere
€95.67
Tabular layouts of article characteristics for semiconductor diodes
€34.30
Tabular layouts of article characteristics for transistors and thyristors
Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
€63.27
