Semiconductor devices; discrete devices; part 3: signal diodes and regulator diodes; identical with IEC 60747-3:1985
€111.40
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM) - Dispositifs à semiconducteurs
€43.67
Obsolescence electronic components - Rules concerning the treatment of product discontinuance and replacement - Obsolescence des composants électroniques
€77.67
Electronic equipment obsolescence - Guide applied obsolescence management - Obsolescence des équipements électroniques
€126.00
Mechanical standardization of semiconductor devices - Part 6-22 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silicon Fine-pitch Land Grid Array (SFBGA and S-FLGA)
€95.67
Semiconductor devices - Micro-electromechanical devices - Part 14 : forming limit measuring method of metallic film materials - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 13 : bend - and shear - type test methods of measuring adhesive strenght for MEMS structures - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 18 : bend testing methods of thin film materials - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 11 : test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 10 : micro-pillar compression test for MEMS materials - Dispositifs à semiconducteur
LED modules for general lighting - Safety specifications - Modules de DEL pour éclairage général
€76.00
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 19 : compas électroniques
Semiconductor devices - Mechanical and climatic test methods - Part 28 : Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM)
€158.33
Semiconductor devices - Mechanical and climatic test methods - Part 42 : temperature humidity storage - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates - Dispositifs à semiconducteurs
