Semiconductor devices - Micro-electromechanical devices - Part 21 : test method for Poisson's ratio of thin film MEMS materials - Dispositifs à semiconducteurs
€95.67
Semiconductor devices - Micro-electromechanical devices - Part 20 : gyroscopes
€166.33
General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions - Éclairage général
€87.39
Organic light emitting diode displays - Part 1-2 : terminology and letter symbols
€71.50
Semiconductor devices - Mechanical and climatic test methods - Part 40 : board level drop test method using a strain gauge - Dispositifs à semiconducteurs
€111.67
Semiconducteur devices - Mechanical and climatic test methods - Part 34 : power cycling - Dispositifs à semiconducteurs
€77.67
LED modules for general lighting - Safety specifications - Modules de DEL pour éclairage général
€76.00
Organic light emitting diode (OLED) displays - Part 6-2 : measuring methods of visual quality and ambient performance
€149.33
Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
€138.00
Mechanical standardization of semiconductor devices - Part 6-12 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch land grid array (FLGA)
Semiconductor devices - Mechanical and climatic test methods - Part 29 : latch-up test - Dispositifs à semiconducteurs
€93.67
LCD backlight unit - Part 1-2 : terminology and letter symbols
€109.00
Organic light emitting diode (OLED) displays - Part 6-3 : measuring methods of image quality
€120.00
Semiconductor devices - Micro-electromechanical devices - Part 12 : bending fatigue testing method of thin film materials using resonant vibration of MEMS structures - Dispositifs à semiconducteurs
€126.00
Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches