Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
€50.00
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
€35.00
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
€28.00
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
€69.00
IEC 60050-523:2018 International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
€186.00
IEC 60050-521:2002/AMD2:2018 Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
€12.00
IEC 62047-32:2019 Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
€133.00
IEC 62830-4:2019 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
€302.00
IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
€93.00
IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
IEC 62951-7:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
IEC 60749-17:2019 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
€46.00
IEC 60749-18:2019 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
