31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN IEC 47(CO)1261:1992-08

DIN IEC 47(CO)1261:1992-08

Withdrawn Most Recent

Semiconductor devices; measuring methods for GaAs field-effect transistors used in microwave applications; identical with IEC 47(Central office)1261

€48.79

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DIN IEC 47(CO)1320:1992-12

DIN IEC 47(CO)1320:1992-12

Withdrawn Most Recent

Semiconductor devices - Essential ratings and characteristics for Gate Turn-Off (GTO) thyristors; identical with IEC 47(Central Office)1320

€34.30

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DIN IEC 47(CO)1246:1993-01

DIN IEC 47(CO)1246:1993-01

Withdrawn Most Recent

Electrostatic sensitive semiconductor devices sensitive to voltage pulses of short duration; test methods; identical with IEC 47(Central Office)1246

€34.30

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DIN IEC 47(CO)1253:1993-01

DIN IEC 47(CO)1253:1993-01

Withdrawn Most Recent

Semiconductor devices; new and revised terms and definitions; identical with IEC 47/1(IEV 521)(Central Office)1253/1320

€77.20

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DIN IEC 47(CO)1316:1993-01

DIN IEC 47(CO)1316:1993-01

Superseded Historical

Semiconductor devices; resistance of semiconductor SMDs to the combined effect of moisture and soldering heat; identical with IEC 47(Central Office)1316

€48.79

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DIN IEC 47(CO)1335:1993-01

DIN IEC 47(CO)1335:1993-01

Superseded Historical

Semiconductor devices; general terms; revision of IEC 747-7, chapter II, clause 2; identical with IEC 47(Central Office)1335

€34.30

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DIN IEC 47(Sec)1284:1993-02

DIN IEC 47(Sec)1284:1993-02

Withdrawn Most Recent

Semiconductor devices; list of recommended subscripts in IEC 60747-1, partial revision; identical with IEC 47(Secretariat)1284

€56.17

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DIN IEC 47(CO)1315:1993-05

DIN IEC 47(CO)1315:1993-05

Withdrawn Most Recent

Semiconductor devices; pulse concepts and input-to-output pulse switching times; identical with IEC 47(Central Office)1315:1992

€48.79

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DIN IEC 47(Sec)1312:1993-06

DIN IEC 47(Sec)1312:1993-06

Withdrawn Most Recent

Semiconductor devices; additional concepts for field-effect transistors; identical with IEC 47(Secretariat)1312:1993

€41.78

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DIN IEC 47(Sec)1252:1993-06

DIN IEC 47(Sec)1252:1993-06

Superseded Historical

Semiconductor devices; new concepts and letter symbols for feld-effect transistors; identical with IEC 47(Secretariat)1252:1991

€34.30

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DIN IEC 47(Sec)1282:1993-06

DIN IEC 47(Sec)1282:1993-06

Superseded Historical

Semiconductor devices; ratings and characteristics and measuring methods for insulated gate bipolar transistors (IGBTs); identical with IEC 47(Secretariat)1282:1992

€56.17

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DIN IEC 47(Sec)1299:1993-06

DIN IEC 47(Sec)1299:1993-06

Superseded Historical

Semiconductor devices; measuring methods for semiconductor pressure sensor elements; identical with IEC 47(Secretariat)1299:1992

€48.79

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DIN IEC 47(Sec)1300:1993-06

DIN IEC 47(Sec)1300:1993-06

Superseded Historical

Semiconductor devices; essential ratings and characteristics for semiconductor pressure sensor elements; identical with IEC 47(Secretariat)1300:1992

€34.30

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DIN IEC 47(CO)1338:1993-07

DIN IEC 47(CO)1338:1993-07

Withdrawn Most Recent

Semiconductor devices; assessment of quality levels in PPM; identical with IEC 47(Central Office)1338:1992

€34.30

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DIN IEC 47(CO)1339:1993-07

DIN IEC 47(CO)1339:1993-07

Superseded Historical

Semiconductor devices; insulated-gate bipolar transistors; terms and definitions; identical with IEC 60047(Central Office)1339:1992

€41.78

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