31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN IEC 62047-3:2004-08

DIN IEC 62047-3:2004-08

Superseded Historical

Microelectromechanical devices - Part 3: Thin film standard test piece (IEC 47/1760/CD:2004)

€41.78

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DIN EN 60749-34:2004-10

DIN EN 60749-34:2004-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2004); German version EN 60749-34:2004.

€69.91

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DIN IEC 60747-9:2004-09

DIN IEC 60747-9:2004-09

Withdrawn Most Recent

Semiconductor devices - Discrete devices - Part 9: Insulated gate bipolar transistors (IGBTs) (IEC 47E/258/CD:2004)

€167.66

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DIN IEC 62373:2004-09

DIN IEC 62373:2004-09

Superseded Historical

Bias-Temperature Stability Test for MOSFET (IEC 47/1763/CD:2004)

€91.03

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DIN IEC 62374:2004-09

DIN IEC 62374:2004-09

Superseded Historical

Time Dependent Dielectric Breakdown Test (TDDB) (IEC 47/1764/CD:2004)

€91.03

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DIN IEC 60747-16-1/A1:2004-11

DIN IEC 60747-16-1/A1:2004-11

Superseded Historical

Semiconductor devices - Discrete devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 47E/264/CD:2004)

€98.32

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DIN IEC 60749-35:2004-12

DIN IEC 60749-35:2004-12

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for non-hermetic encapsulated electronic components (IEC 47/1769/CD:2004)

€98.32

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DIN IEC 62113:2004-12

DIN IEC 62113:2004-12

Withdrawn Most Recent

Semiconductors Product - Discontinuance notification for semiconductors (IEC 47/1777A/CDV:2004)

€41.78

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DIN IEC 60747-4:2005-01

DIN IEC 60747-4:2005-01

Withdrawn Most Recent

Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors (IEC 47E/265/CD:2004)

€364.11

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DIN IEC 60749-20-1:2005-02

DIN IEC 60749-20-1:2005-02

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling, shipping and use of moisture/reflow sensitive surface mount devices (IEC 47/1775/CD:2004)

€111.40

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DIN EN 60747-16-4:2005-03

DIN EN 60747-16-4:2005-03

Superseded Historical

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004); German version EN 60747-16-4:2004.

€105.42

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DIN EN 60749-26:2005-05

DIN EN 60749-26:2005-05

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 47/1803/CDV:2005); German version prEN 60749-26:2005

€77.20

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DIN EN 60749-27:2005-05

DIN EN 60749-27:2005-05

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 47/1804/CDV:2005); German version prEN 60749-27:2005

€77.20

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DIN EN 60749-21:2005-06

DIN EN 60749-21:2005-06

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 60749-21:2004); German version EN 60749-21:2005.

€98.32

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DIN IEC 60191-1:2005-06

DIN IEC 60191-1:2005-06

Superseded Historical

Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (IEC 47D/607A/CD:2005)

€122.34

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