31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN EN 60749-19/A1:2009-10

DIN EN 60749-19/A1:2009-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 47/2016/CDV:2009); German version EN 60749-19:2003/FprA1:2009

€41.78

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DIN EN 60749-30/A1:2009-10

DIN EN 60749-30/A1:2009-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 47/2019/CDV:2009); German version EN 60749-30:2005/FprA1:2009

€48.79

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DIN EN 60749-7:2009-10

DIN EN 60749-7:2009-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 47/2021/CDV:2009); German version FprEN 60749-7:2009

€69.91

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DIN EN 62258-2:2009-10

DIN EN 62258-2:2009-10

Superseded Historical

Semiconductor die products - Part 2: Exchange data formats (IEC 47/2023/CDV:2009); English version FprEN 62258-2:2009

€185.05

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DIN EN 60749-21:2009-10

DIN EN 60749-21:2009-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 47/2025/CDV:2009); German version FprEN 60749-21:2009

€105.42

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DIN EN 60749-34:2009-10

DIN EN 60749-34:2009-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 47/2027/CDV:2009); German version FprEN 60749-34:2009

€63.27

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DIN EN 60749-29:2009-11

DIN EN 60749-29:2009-11

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/2026/CDV:2009); German version FprEN 60749-29:2009

€111.40

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DIN EN 60749:2001-09

DIN EN 60749:2001-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000); German version EN 60749:1999 + A1:2000.

€140.00

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DIN EN 60747-16-1:2002-07

DIN EN 60747-16-1:2002-07

Superseded Historical

Semiconductor devices - Part 16-1: Microwave integrated circuits; Amplifiers (IEC 60747-16-1:2001); German version EN 60747-16-1:2002.

€134.02

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DIN EN 60749:2002-09

DIN EN 60749:2002-09

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000 + A2:2001); German version EN 60749:1999 + A1:2000 + A2:2001.

€162.06

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DIN 41790:1967-04

DIN 41790:1967-04

Superseded Historical

Semiconductor devices - Recommendations for data sheets - Voltage reference and voltage regulator diodes

€24.39

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DIN IEC 47E/120/CDV:1999-02

DIN IEC 47E/120/CDV:1999-02

Withdrawn Most Recent

Sensor generals and classification for semiconductor sensors (IEC 47E/120/CDV:1998)

€56.17

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DIN IEC 47E/121/CDV:1999-02

DIN IEC 47E/121/CDV:1999-02

Withdrawn Most Recent

Semiconductor devices - Discrete devices - Hall elements (IEC 47E/121/CDV:1998)

€56.17

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DIN IEC 47E/36A/CDV:2000-04

DIN IEC 47E/36A/CDV:2000-04

Withdrawn Most Recent

Amendment to IEC 60747-7: Bipolar transistors (IEC 47E/36A/CDV:1996)

€48.79

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DIN IEC 47E/37/CDV:2000-04

DIN IEC 47E/37/CDV:2000-04

Withdrawn Most Recent

Amendment to IEC 60747-8: Field-effect transistors (IEC 47E/37/CDV:1996)

€48.79

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