Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/353/CD:2007)
€98.32
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 60749-19:2003); German version EN 60749-19:2003 + Corrigendum 2003-06.
€41.78
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2003); German version EN 60749-15:2003.
€56.17
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2002 + Corr. 1:2003); German version EN 60749-20:2003.
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2003 + Corr. 1:2003); German version EN 60749-32:2003 + Corr.:2003.
Semiconductor devices - Part 1: Microelectromechanical devices; Terms and definitions (IEC 47/1695A/CD:2003)
Semiconductor devices - Part 1: General (IEC 47/1734/CD:2003)
€122.34
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2003); German version EN 60749-29:2003 + Corrigendum:2004.
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection (IEC 63364-1:2022); German version EN IEC 63364-1:2023
€84.58
Harmonized system of quality assessment for electronic components; blank detail specification: general purpose semiconductor diodes
€69.91
Signal devices; amendment to IEC publication 60147-1, chapter II, section three, switching transistors
€34.30
Semiconductor devices and integrated circuits; general principles of measuring methods; low-power signal diodes, forward recovery time and forward transient voltage
Harmonized system of quality assessment for electronic components; blank detail specification: ambient rated rectifier diodes
Harmonized system of quality assessment for electronic components; blank detail specification: ambient rated thyristors
Harmonized system of quality assessment for electronic components; blank detail specification: variable capacitance diode(s)
€48.79