Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996); German version EN 60749:1999.
€116.64
Amendment 1 to IEC 60747-9: Insulated gate bipolar transistors (IGBTs) (IEC 47E/114/CDV:1998)
€91.03
Semiconductor devices - Discrete devices - Part 8-12: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications (IEC 47E/199/CD:2001)
€157.10
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 47/1583/CDV:2001); German version prEN 60749-15:2001
€41.78
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) test (IEC 47/1584/CDV:2001); German version prEN 60749-16:2001
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 47/1588/CDV:2001); German version prEN 60749-17:2001
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionising Radiation (total dose); Test procedure (IEC 47/1589/CDV:2001); German version prEN 60749-18:2001
€69.91
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test (IEC 47/1590/CDV:2001); German version prEN 60749-19:2001
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration steady state (IEC 47/1585/CDV:2001); German version prEN 60749-36:2001
IEC 60747-4: Terminology, essential ratings and characteristics and measuring methods for integrated circuit microwave power amplifiers (IEC 47E/131/CDV:1999)
€63.27
IEC 60747-14-3: Discrete seminconductor devices - Part 14-3: Semiconductor pressure sensors (IEC 47E/132/CDV:1999)
International Electrotechnical Vocabulary - Chapter 521: Semiconductor devices and integrated circuits (IEC 60050-521:1984 and IEC 1/1775/CDV:1999)
€134.02
Discrete semiconductor devices - Part 16-4: Terminology, essential ratings and characteristics, and measuring methods for integrated circuit microwave switches (IEC 47E/185/CD:2001)
€111.40
Discrete semiconductor devices - Part 15: Isolated power devices (IEC 47E/189/CDV:2001)
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady state temperature humidity bias life test (IEC 47/1600/CDV:2002); German version prEN 60749-5:2002
€48.79
