Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low frequency, low power transistors
€269.00
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high frequency, low power transistors
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for linear applications
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for switching applications
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: switching transistors
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: transistors (general)
Rules for the preparation of detail specifications for fusible link programmable read-only memories of assessed quality (full assessment level)
€193.00
Code of practice on the use semiconductor devices. General considerations
Code of practice for the use semiconductor devices Particular considerations
General principles of measuring methods; current regulator diodes
€34.30
Essential ratings and characteristics; high-frequency power transistors for amplifier and oscillator applications
€24.39
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 47/1857/CD:2006)
€111.40
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2002); German version EN 60749-7:2002.
€56.17
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing; Charged device model (CDM) (IEC 47/1658/CD:2002)
€63.27
Semiconductor devices - Discrete devices - Part 7-5: Bipolar transistors (BTRs) for power switching applications (IEC 47E/234/CD:2002)
