Testing of materials for semiconductor technology; measurement of the geometric dimensions of semiconductor slices; terms of flatness deviation
€48.79
Testing of materials for semiconductor technology; methods for characterizing photoresists; determination of coating thickness with optical methods
€34.30
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Determination of the thermo-mechanical dilatation of epoxy resin moulding compounds
Determination of cobalt, chromium, copper, iron and nickel as impurities in hydrofluoric acid for use in semiconductor technology by plasma-induced emission spectrometry
Testing of semi-conducting inorganic materials; measurement of the electrical resistivity of silicon or germanium single crystals in bars by means of the two-point-probe direct current method
€24.39
Testing of semi-conducting inorganic materials; measurement of the electrical resistivity of silicon or germanium single crystals by means of the four-point-probe direct current method with collinear four probe array
Testing of semi-conducting inorganic materials; determination of the conductivity type of silicon or germanium by means of rectification test or hot-probe
Testing of semiconductive inorganic materials; determination of the geometric dimensions of semiconductor slices; measurement of thickness
Testing of semi-conductive inorganic materials; determination of the surface structure of circular monocrystalline semi-conductive slices; as-cut and lapped slices
Testing of semi-conductive inorganic materials; determination of impurity content in silicon by infrared absorption; oxygen
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
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Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]
Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Standard Guide for Analysis of Crystallographic Perfection of Silicon Ingots
