IEC 60146-2:1999 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
€342.00
Semiconductor devices - Part 16-3 : microwave integrated circuits - Frequency converters
€59.33
Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
Semiconductor devices - Micro-electromechanical devices - Part 14 : forming limit measuring method of metallic film materials - Dispositifs à semiconducteurs
€95.67
Semiconductor devices - Micro-electromechanical devices - Part 13 : bend - and shear - type test methods of measuring adhesive strenght for MEMS structures - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 18 : bend testing methods of thin film materials - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 11 : test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 10 : micro-pillar compression test for MEMS materials - Dispositifs à semiconducteur
€77.67
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 19 : compas électroniques
€126.00
Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 21 : test method for Poisson's ratio of thin film MEMS materials - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 20 : gyroscopes
€166.33
Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
€138.00
Semiconductor devices - Micro-electromechanical devices - Part 12 : bending fatigue testing method of thin film materials using resonant vibration of MEMS structures - Dispositifs à semiconducteurs
