Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock (IEC 60749-10:2002); German version EN 60749-10:2002.
€41.78
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2002); German version EN 60749-12:2002.
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2002); German version EN 60749-13:2002.
€56.17
Semiconductor devices - Mechanical and climatic test methods
€97.00
Semiconductor devices - Mechanical and climatic test methods.
€58.00
€79.00
Semiconductor devices - Mechanical and climatic test methods -- Part 7: Internal moisture content measurement and the analysis of other residual gases.
€47.00
Semiconductor devices - Mechanical and climatic test methods -- Part 15: Resistance to soldering temperature for through-hole mounted devices
€40.00
Mechanical standardization of semiconductor devices -- Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch land grid array (FLGA) - Rectangular type
€69.00
Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
€73.00
Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
€50.00
Composants électroniques - Système CENELEC d'assurance de la qualité - Dispositifs discrets à semiconducteurs - Spécification générique.
€91.00
Microstructures - Microélectronique hyperfréquence - Mélangeurs de réception - Prescriptions générales.
€119.00
Microstructures - Microélectronique hyperfréquence - Détecteurs - Prescriptions générales.
