Additif 1 à la publication UTE C 96-315 de décembre 1988
€166.33
Binary floating-point arithmetic for microprocessor systems.
€95.67
Dispositifs hyperfréquences - Lignes à retard actives
€77.67
Additif 2 à la publication UTE C 96-315 de décembre 1988
€59.33
IEC 822 VSB. Parallel sub-system bus of the IEC 821 VMEBUS.
€252.67
SEMICONDUCTOR DEVICES. PART 11: SECTIONAL SPECIFICATION FOR DISCRETE DEVICES.
€61.00
IEC 822 VSB. PARALLEL SUB-SYSTEM BUS OF THE IEC 821 VMEBUS.
€157.00
Components for low-voltage surge protection - Part 341: Performance requirements and test circuits for thyristor surge suppressors (TSS)
€129.00
Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
€101.00
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM) - Dispositifs à semiconducteurs
Semiconductor devices - Mechanical and climatic test methods - Part 33 : accelerated moisture resistance - unbiased autoclave - Dispositifs à semiconducteurs
€70.33
Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers
€153.00
Semiconductor devices - Part 16-3 : microwave integrated circuits - Frequency converters
€125.00
Semiconductor devices - Mechanical and climatic test methods - Part 8 : sealing - Dispositifs à semiconducteurs
Semiconductor devices - Mechanical and climatic test methods - Part 22 : bond strength - Dispositifs à semiconducteurs
