Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced) - Dispositifs à semiconducteurs
€43.67
Semiconductor devices - Mechanical and climatic test methods - Part 32 : flammability of plastic-encapsulated devices (externally induced) - Dispositifs à semiconducteurs
€28.00
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing - Dispositifs à semiconducteurs
€74.00
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
€35.00
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
€50.00
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
€59.00
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
€47.00
Composants pour parafoudres basse tension - Partie 322 : Principes de sélection et d'application pour les limiteurs de tension à jonction PN de semiconducteurs silicium
€125.00
Blank detail specification : phototransistors, photodarlington transistors, phototransistor arrays
€91.00
Blank detail specification : ambient rated photocouplers with phototransistor output
€106.33
Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation
€77.67
Semiconductor devices - Mechanical and climatic test methods - Part 18 : Ionizing radiation (total dose)
€111.67
Electronic components - Long-term storage of electronic semiconductor devices - Part 4 : storage
€111.96
