31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
NF EN 60191-6-3, C96-013-6-3 (04/2001)

NF EN 60191-6-3, C96-013-6-3 (04/2001)

Active Most Recent

Mechnical standardization of semiconductor devices - Part 6-3 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)

€86.33

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NF EN 60749-2, C96-022-2 (12/2002)

NF EN 60749-2, C96-022-2 (12/2002)

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Semiconductor devices - Mechanical and climatic test methods - Part 2 : low air pressure - Dispositifs à semiconducteurs

€59.33

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NF EN 60749-10, C96-022-10 (12/2002)

NF EN 60749-10, C96-022-10 (12/2002)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 10 : mechanical shock - Dispositifs à semiconducteurs

€56.33

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NF EN 60749-11, C96-022-11 (12/2002)

NF EN 60749-11, C96-022-11 (12/2002)

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Semiconductor devices - Mechanical and climatic test methods - Part 11 : rapid change of temperature - Two-fluid-bath method - Dispositifs à semiconducteurs

€59.33

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NF EN 60191-4/A1, C96-013-4/A1 (05/2002)

NF EN 60191-4/A1, C96-013-4/A1 (05/2002)

Superseded Historical

Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages

€54.50

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NF EN 60749-1, C96-022-1 (11/2003)

NF EN 60749-1, C96-022-1 (11/2003)

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Semiconductor devices - Mechanical and climatic test methods - Part 1 : general - Dispositifs à semiconducteurs

€59.33

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NF EN 60191-4/A2, C96-013-4/A2 (04/2003)

NF EN 60191-4/A2, C96-013-4/A2 (04/2003)

Superseded Historical

Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages

€42.67

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NF EN 60191-6-4, C96-013-6-4 (11/2003)

NF EN 60191-6-4, C96-013-6-4 (11/2003)

Active Most Recent

Mechanical standardization of semiconductor devices - Part 6-4 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of ball grid array (BGA)

€95.67

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NF EN 60749-16, C96-022-16 (07/2003)

NF EN 60749-16, C96-022-16 (07/2003)

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Semiconductor devices - Mechanical and climatic test methods - Part 16 : particle impact noise dectection (PIND) - Dispositifs à semiconducteurs

€59.33

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NF EN 60749-36, C96-022-36 (08/2003)

NF EN 60749-36, C96-022-36 (08/2003)

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Semiconductor devices - Mechanical and climatic test methods - Part 36 : acceleration steady state - Dispositifs à semiconducteurs

€43.67

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NF EN 60749-17, C96-022-17 (08/2003)

NF EN 60749-17, C96-022-17 (08/2003)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation - Dispositifs à semiconducteurs

€56.33

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NF EN 60749-18, C96-022-18 (05/2003)

NF EN 60749-18, C96-022-18 (05/2003)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 18 : ionizing radiation (total dose) - Dispositifs à semiconducteurs

€91.00

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NF EN 60749-19, C96-022-19 (08/2003)

NF EN 60749-19, C96-022-19 (08/2003)

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Semiconductor devices - Mechanical and climatic test methods - Part 19 : die shear strength - Dispositifs à semiconducteurs

€59.33

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NF EN 60191-6-1, C96-013-6-1 (08/2002)

NF EN 60191-6-1, C96-013-6-1 (08/2002)

Active Most Recent

Mechanical standardization of semiconductor devices - Part 6-1 : general rules for the preparation of outline drawings of surface mounted semiconductor device parkages - Design guide for gull-wing lead terminals

€53.67

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NF EN 60191-6-5, C96-013-6-5 (08/2002)

NF EN 60191-6-5, C96-013-6-5 (08/2002)

Active Most Recent

Mechanical standardization of semiconductor devices - Part 6-5 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch ball grid array (FBGA)

€60.85

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