Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
€404.00
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output
€269.00
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for binary floating point arithmetic for microprocessor systems
€193.00
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life - Dispositifs à semiconducteurs
€37.33
€28.00
RECOMMENDED GRAPHICAL AND LITERAL SYMBOLS. SEMICONDUCTORS DEVICES, CONDENSERS.
€59.00
Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
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Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)
Test Method for Detection of Epitaxial Spikes (Withdrawn 1999)
Standard Specification for Semiconductor Device Passivation Opening Layouts (Withdrawn 2007)
Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)
GRAPHICAL SYMBOLS FOR DIAGRAMS. PART 5: SEMICONDUCTORS AND ELECTRON TUBES.
€82.00
Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
