31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
BS EN 60749-28:2017

BS EN 60749-28:2017

Superseded Historical

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

€355.00

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BS EN 62298-3:2005

BS EN 62298-3:2005

Active Most Recent

Teleweb application Superteletext profile

€404.00

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BS EN 60191-6-10:2003

BS EN 60191-6-10:2003

Active Most Recent

Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages Dimensions P-VSON

€193.00

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BS EN 60191-6-2:2002

BS EN 60191-6-2:2002

Active Most Recent

Mechanical standardization of semiconductor devices. General rules for the preparation outline drawings surface mounted device packages Design guide 1,50 mm, 1,27 mm and 1,00 pitch ball column terminal

€165.00

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PD IEC TR 62380:2004

PD IEC TR 62380:2004

Withdrawn Most Recent

Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment

€404.00

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BS EN 62047-2:2006

BS EN 62047-2:2006

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials

€193.00

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BS EN 61967-2:2005

BS EN 61967-2:2005

Active Most Recent

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz radiated emissions. TEM cell and wideband method

€269.00

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BS EN 62374:2007

BS EN 62374:2007

Active Most Recent

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

€269.00

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BS EN 62373:2006

BS EN 62373:2006

Active Most Recent

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

€193.00

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BS EN 60749-11:2002

BS EN 60749-11:2002

Active Most Recent

Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method

€165.00

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BS EN 62047-3:2006

BS EN 62047-3:2006

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing

€165.00

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BS EN 60730-1:1995

BS EN 60730-1:1995

Active Most Recent

Automatic electrical controls for household and similar use General requirements

€404.00

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BS IEC 60747-5-4:2006

BS IEC 60747-5-4:2006

Superseded Historical

Semiconductor devices. Discrete devices Optoelectronic lasers

€269.00

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BS IEC 60747-9:2007

BS IEC 60747-9:2007

Superseded Historical

Semiconductor devices. Discrete devices Insulated-gate bipolar transistors (IGBTs)

€374.00

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BS EN 60191-6-18:2010

BS EN 60191-6-18:2010

Active Most Recent

Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide ball grid array (BGA)

€269.00

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