Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide stacked Fine-pitch ball grid array and fine-pitch land (P-PFBGA P-PFLGA)
€269.00
Semiconductor die products XML schema for data exchange
Varnishes used for electrical insulation Methods of test
Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials
€193.00
Semiconductor devices. Hot carrier test on MOS transistors
€165.00
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices sensors. PN-junction semiconductor temperature sensor
Semiconductor die products Procurement and use
€355.00
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages
€316.00
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect moisture soldering heat
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor die products EXPRESS model schema for data exchange
Semiconductor devices General
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
