Semiconductor devices. Mechanical and climatic test methods Sealing
€193.00
Semiconductor devices. Mechanical and climatic test methods Bond strength
€269.00
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
€165.00
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
Mechanical standardization of semiconductor devices Recommendations applying to tape automated bonding (TAB) integrated circuits
€316.00
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
Evaluation and routine testing in medical imaging departments Acceptance tests Imaging performance of X-ray equipment for radiographic radiscopic systems
€374.00
Environmental testing. Test methods Body strength and impact shock
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
