Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using photoluminescence
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Semiconductor devices. Discrete devices Microwave diodes and transistors
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BS EN 61643-321. Components for low-voltage surge protective devices Part 321. Performance requirements and test circuits silicon PN-junction voltage limiters
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Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
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BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
IEC 62384:2020 DC or AC supplied electronic controlgear for LED modules - Performance requirements
€93.00
IEC 61954:2021 Static VAR compensators (SVC) - Testing of thyristor valves
€342.00
IEEE Guide for the Application of Thyristor Surge Protective Device Components
€135.00
EOS-Electrical Overstress in the Automotive Industry, Dealing with semiconductor devices showing a signature of electrial overstress, Contents, documentations and explanations 1st Edition, January 2020
€46.25
IEC 63378-6:2026 Thermal standardization on semiconductor packages - Part 6: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points
€244.00
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation Hardness Testing of Electronics
€94.00
Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards (Withdrawn 2008)
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Composants hyperfréquences - Caractéristiques dimensionnelles - Recueil de feuilles de boîtiers relatifs aux composants hyperfréquences
€95.67
