31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
IEC 62007-2:2009

IEC 62007-2:2009

Superseded Historical

IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

€302.00

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IEC 62047-6:2009

IEC 62047-6:2009

Active Most Recent

IEC 62047-6:2009 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials

€93.00

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IEC 62258-1:2009

IEC 62258-1:2009

Active Most Recent

IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use

€342.00

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IEC 60747-14-3:2009

IEC 60747-14-3:2009

Active Most Recent

IEC 60747-14-3:2009 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors

€133.00

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IEC 62384:2006/AMD1:2009

IEC 62384:2006/AMD1:2009

Superseded Historical

IEC 62384:2006/AMD1:2009 Amendment 1 - DC or AC supplied electronic control gear for LED modules - Performance requirements

€12.00

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IEC 60191-6:2009

IEC 60191-6:2009

Active Most Recent

IEC 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages

€302.00

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IEC 60191-6-18:2010

IEC 60191-6-18:2010

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IEC 60191-6-18:2010 Mechanical standardization of semiconductor devices - Part 6-18: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for ball grid array (BGA)

€133.00

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IEC 60747-14-1:2010

IEC 60747-14-1:2010

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IEC 60747-14-1:2010 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors

€186.00

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IEC 60747-14-5:2010

IEC 60747-14-5:2010

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IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

€133.00

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IEC 60191-6-19:2010

IEC 60191-6-19:2010

Active Most Recent

IEC 60191-6-19:2010 Mechanical standardization of semiconductor devices - Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage

€93.00

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IEC 62418:2010

IEC 62418:2010

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IEC 62418:2010 Semiconductor devices - Metallization stress void test

€133.00

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IEC 62417:2010

IEC 62417:2010

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IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

€23.00

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IEC 62416:2010

IEC 62416:2010

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IEC 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors

€46.00

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IEC 60747-1:2006/AMD1:2010

IEC 60747-1:2006/AMD1:2010

Active Most Recent

IEC 60747-1:2006/AMD1:2010 Amendment 1 - Semiconductor devices - Part 1: General

€12.00

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IEC 62415:2010

IEC 62415:2010

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IEC 62415:2010 Semiconductor devices - Constant current electromigration test

€46.00

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