31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
NF EN 62007-1, C93-801-1 (10/2015)

NF EN 62007-1, C93-801-1 (10/2015)

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Semiconductor optoelectronic devices for fibre optic system applications - Part 1 : specification template for essential ratings and characteristics

€107.86

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NF EN 62047-25, C96-050-25 (12/2016)

NF EN 62047-25, C96-050-25 (12/2016)

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Semiconductor devices - Micro-electromechanical devices - Part 25 : silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area

€111.67

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NF EN 62047-16, C96-050-16 (11/2015)

NF EN 62047-16, C96-050-16 (11/2015)

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Semiconductor devices - Micro-electromechanical devices - Part 16 : test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods

€77.67

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NF EN 62047-26, C96-050-26 (06/2016)

NF EN 62047-26, C96-050-26 (06/2016)

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Semiconductor devices - Micro-electromechanical devices - Part 26 : description and measurement methods for micro trench and needle structures

€93.67

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NF EN 60191-4, C96-013-4 (09/2000)

NF EN 60191-4, C96-013-4 (09/2000)

Superseded Historical

Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages

€96.59

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NF EN 62258-6, C96-034-6 (12/2006)

NF EN 62258-6, C96-034-6 (12/2006)

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Semiconductor die products - Part 6 : requirements for information concerning thermal simulation

€62.50

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NF EN 60749-39, C96-022-39 (12/2006)

NF EN 60749-39, C96-022-39 (12/2006)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components - Dispositifs à semiconducteurs

€59.33

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NF EN 60749-37, C96-022-37 (07/2008)

NF EN 60749-37, C96-022-37 (07/2008)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 37 : board level drop test method using an accelerometer - Dispositifs à semiconducteurs

€106.33

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NF EN 62031, C71-250 (12/2008)

NF EN 62031, C71-250 (12/2008)

Superseded Historical

LED modules for general lighting - Safety specifications - Modules de del pour éclairage général

€91.00

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NF EN 60749-38, C96-022-38 (06/2008)

NF EN 60749-38, C96-022-38 (06/2008)

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Semiconductor devices - Mechanical and climatic test methods - Part 38 : soft error test method for semiconductor devices with memory - Dispositifs à semiconducteurs

€95.67

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NF EN 62341-1-2, C96-541-1-2 (05/2010)

NF EN 62341-1-2, C96-541-1-2 (05/2010)

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Organic light emitting diode displays - Part 1-2 : terminology and letter symbols

€112.50

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NF EN 62341-1-1, C96-541-1-1 (06/2010)

NF EN 62341-1-1, C96-541-1-1 (06/2010)

Active Most Recent

Organic light emitting diode (OLED) displays - Part 1-1 : generic specifications

€99.50

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NF EN 62007-2, C93-801-2 (09/2009)

NF EN 62007-2, C93-801-2 (09/2009)

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Semiconductor optoelectronic devices for fibre optic system applications - Part 2 : measuring methods

€107.86

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NF EN 60749-20, C96-022-20 (02/2010)

NF EN 60749-20, C96-022-20 (02/2010)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 20 : resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat - Dispositifs à semiconducteurs

€106.33

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NF EN 60749-20-1, C96-022-20-1 (07/2009)

NF EN 60749-20-1, C96-022-20-1 (07/2009)

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Semiconductor devices - Mechanical and climatic test methods - Part 20-1 : handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat - Dispositifs à semiconducteurs

€126.00

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